The XDA-315 silicon-based MEMS accelerometer adopts a compact CLCC-14 ceramic package and advanced MEMS sensing technology. It is a high-performance industrial grade 3-axis accelerometer featuring low noise, low temperature drift, excellent long-term stability, and reliable digital output performance.
Número de pieza, :
XDA-315Pedido (MOQ) :
1Product Series and Parameters
| Parameter | Test Conditions | Min | Typ | Max | Unit |
| Measurement range | User selectable | ±2, | g | ||
| ±8 | |||||
| -3 dB Bandwidth | 12.5 | 1000 | Hz | ||
| Nonlinearity | ±2 g | 0.1 | % FS | ||
| ±8 g | 1.2 | ||||
| Cross Axis Sensitivity | 1 | % | |||
| Sensitivity | ±2 g | 256,000 | LSB/g | ||
| ±8 g | 64,000 | ||||
| Sensitivity Change due to Temperature | 1σ, over -40 ~ 85 °C | ±0.01 | %/°C | ||
| Sensitivity Repeatability | 1σ, @25 °C | 0.16 | % | ||
| 0 g Offset Output | X-Axis, Y-Axis, and Z-Axis | −75 | ±25 | 75 | mg |
| 0 g Offset vs. Temperature | −40°C ~ +85°C | −0.15 | ±0.02 | 0.15 | mg/°C |
| 0 g Offset Repeatability | X-axis and y-axis | ±2 | mg | ||
| Z-axis | ±3 | ||||
| Vibration Rectification Error(VRE) | ±2g range, in a 1g orientation, | <0.4 | g | ||
| offset due to 2.5g rms vibration | |||||
| Bias instability, Allan | X-axis and y-axis | 4 | μg | ||
| Z-axis | 9 | ||||
| Noise Spectral Density | 20 | μg/√Hz | |||
| Velocity Random Walk | X-axis and y-axis | 7.5 | mm/s/√Hr | ||
| Z-axis | 10.5 | ||||
| Self Test Output Change | X-axis and y-axis | 0.7 | 1.1 | g | |
| Z-axis | 0.2 | 0.6 | |||
| Output Data Rate | Fsysclk/32 | kHz | |||
| Output Resolution | 20 | Bits | |||
| Turn-on Time | Standby to measurement mode | < 10 | ms | ||
| Temperature Sensor Output at 25°C (T25) Scale Factor (TSF) |
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| 5017.6 | LSB | ||||
| 133.8 | LSB/°C |
Production process
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